Microfabricated atomic frequency references
نویسندگان
چکیده
منابع مشابه
Chip-Scale Atomic Frequency References
We describe recent efforts at NIST to develop chip-scale atomic frequency references based on microfabrication techniques commonly used in microelectromechanical systems (MEMS). These frequency references are projected to have a volume of 1 cm, a power dissipation of 30 mW and a fractional frequency instability of 10 at one hour of integration. To date, we have demonstrated the three critical s...
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We propose a sub-millimeter-scale vapor-cell atomic-frequency reference based on a micromachined vapor cell, all-optical excitation, and advanced diode-laser technology. We analyze theoretically the performance of such a device as a function of cell size. Initial measurements on small-scale vapor cells support the theoretical treatment. © 2002 American Institute of Physics. @DOI: 10.1063/1.1494...
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The physics package for a chip-scale atomic frequency reference was constructed and tested. The device has a total volume of 9.5 mm, dissipates 75 mW of electrical power at an ambient temperature of 45 °C and has a short-term fractional frequency instability of 2.4×10/ . Advanced cell fabrication techniques indicate a long-term instability near 10 may be feasible.
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A low-cost, potentially compact and robust microwave frequency reference can be constructed by use of vertical-cavity surface-emitting lasers and coherent population-trapping resonances in Cs vapor cells. Fractional frequency instabilities of 2 3 10211/At/s have been achieved with a minimum of 7 3 10213 at t 5 1000 s. The performance of this device as a function of external parameters such as l...
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This paper presents the latest progress in the development, fabrication, and characterization of microfabricated atomic frequency references at NIST. With volumes below 10 mm the physics packages contain the complete integrated assembly for probing the ground-state hyperfine splitting frequency of the alkali atoms by coherent population trapping (CPT). This technique allows for a simple and com...
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ژورنال
عنوان ژورنال: Metrologia
سال: 2005
ISSN: 0026-1394,1681-7575
DOI: 10.1088/0026-1394/42/3/s11